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Please use this identifier to cite or link to this item: http://142.54.178.187:9060/xmlui/handle/123456789/1206
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dc.contributor.authorAwais, Muhammad N.-
dc.contributor.authorMustafa, Maria-
dc.contributor.authorShehzad, Muhammad N.-
dc.contributor.authorFarooq, Umer-
dc.contributor.authorHamayun, Mirza T.-
dc.date.accessioned2019-11-14T06:41:47Z-
dc.date.available2019-11-14T06:41:47Z-
dc.date.issued2016-10-31-
dc.identifier.issn1750-0443-
dc.identifier.urihttp://142.54.178.187:9060/xmlui/handle/123456789/1206-
dc.description.abstractPoly[(9,9-di-n-octylfluorenyl-2,7-diyl)-alt-(benzo[2,1,3]thiadiazol-4,8-diyl)] (F8BT) polymer has been investigated to elucidate the resistive-switching properties in a sandwiched structure of indium tin oxide (ITO)/F8BT/aluminium (Al). An active layer of F8BT polymer was deposited on the ITO-coated polyethylene terepthalate through spin coating. Morphologically, the layer was characterised with field emission scanning electron microscope. The fabricated sample showed resistive-switching properties within ±5 V with an OFF/ON ratio of 10:1. The switching characteristics were attributed to the transition of trap-limited space charge-limited conduction (SCLC) to trap-filled SCLC. It is shown through energy band diagram that memory effects in the fabricated sample were due to the trapping of electrons in the F8BT active layer that were injected from the top Al electrode.en_US
dc.language.isoen_USen_US
dc.publisherIETen_US
dc.subjectCOMSATSen_US
dc.subjecttin compoundsen_US
dc.subjectspin coatingen_US
dc.subjectaluminiumen_US
dc.subjectfield emission electron microscopesen_US
dc.subjectsemiconductor switchesen_US
dc.subjectscanning electron microscopesen_US
dc.subjectpolymersen_US
dc.subjectindium compoundsen_US
dc.titleResistive-switching and current-conduction mechanisms in F8BT polymer resistive switchen_US
dc.typeArticleen_US
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