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Please use this identifier to cite or link to this item: http://142.54.178.187:9060/xmlui/handle/123456789/1460
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dc.contributor.authorAli, S. M.-
dc.contributor.authorTareen, Nauman Khan-
dc.contributor.authorSami, Irfan-
dc.contributor.authorZahid Ullah-
dc.contributor.authorKhan, Khalid Salman-
dc.contributor.authorFarid, Umar-
dc.contributor.authorKhan, Bilal-
dc.contributor.authorMehmood, C. A.-
dc.contributor.authorJawad, M.-
dc.date.accessioned2019-11-18T10:06:45Z-
dc.date.available2019-11-18T10:06:45Z-
dc.date.issued2018-10-17-
dc.identifier.isbn978-1-5386-8204-3-
dc.identifier.urihttp://142.54.178.187:9060/xmlui/handle/123456789/1460-
dc.description.abstractMulti-correlated failures lead to severe power outages in an inter-connected power network. The critical loads of the data center, such as servers and chillers are highly dependent on the grid power. The service reliability and fault tolerance of the data center becomes challenging under multi-correlated failures. Data miss-management and service unavailability under such scenario will result in the massive revenue loss. To address this problem under multi-correlated failures, a fault tolerant model is proposed to minimize the revenue loss. Moreover, considering the system dynamics, our model maximizes throughput and operational time of the data center. Furthermore, we formulate a stochastic optimized system model that captures power consumption, power distribution, data center generation, data center workload, service deadline, and revenue loss. The effectiveness of the proposed fault-tolerant model is tested and validated using real-time data.en_US
dc.language.isoen_USen_US
dc.publisherIEEE International Symposium on Recent Advances in Electrical Engineering (RAEE)en_US
dc.subjectEngineering and Technologyen_US
dc.subjectElectrical engineeringen_US
dc.subjectServersen_US
dc.subjectData centersen_US
dc.subjectReliabilityen_US
dc.subjectPower system reliabilityen_US
dc.subjectPower demanden_US
dc.subjectFault tolerant systemsen_US
dc.titleFault Tolerance of Data Center under Multi-Correlated Failuresen_US
dc.typeProceedingsen_US
Appears in Collections:Proceedings

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