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Please use this identifier to cite or link to this item: http://142.54.178.187:9060/xmlui/handle/123456789/1206
Title: Resistive-switching and current-conduction mechanisms in F8BT polymer resistive switch
Authors: Awais, Muhammad N.
Mustafa, Maria
Shehzad, Muhammad N.
Farooq, Umer
Hamayun, Mirza T.
Keywords: COMSATS
tin compounds
spin coating
aluminium
field emission electron microscopes
semiconductor switches
scanning electron microscopes
polymers
indium compounds
Issue Date: 31-Oct-2016
Publisher: IET
Abstract: Poly[(9,9-di-n-octylfluorenyl-2,7-diyl)-alt-(benzo[2,1,3]thiadiazol-4,8-diyl)] (F8BT) polymer has been investigated to elucidate the resistive-switching properties in a sandwiched structure of indium tin oxide (ITO)/F8BT/aluminium (Al). An active layer of F8BT polymer was deposited on the ITO-coated polyethylene terepthalate through spin coating. Morphologically, the layer was characterised with field emission scanning electron microscope. The fabricated sample showed resistive-switching properties within ±5 V with an OFF/ON ratio of 10:1. The switching characteristics were attributed to the transition of trap-limited space charge-limited conduction (SCLC) to trap-filled SCLC. It is shown through energy band diagram that memory effects in the fabricated sample were due to the trapping of electrons in the F8BT active layer that were injected from the top Al electrode.
URI: http://142.54.178.187:9060/xmlui/handle/123456789/1206
ISSN: 1750-0443
Appears in Collections:Journals

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