Trapping levels and mobile charge determinations in thin solid films.

Please use this identifier to cite or link to this item: http://localhost:80/xmlui/handle/123456789/12320

Title:	Trapping levels and mobile charge determinations in thin solid films.
Authors:	Dr. F.M. Nazar
Issue Date:	1-May-1981
Publisher:	Centre for Solid State Physics University of the Punjab, New Campus Lahore
Series/Report no.:	(PP-08);P-PU/PHYS(30)
Abstract:	Investigations have been carried out on the determination of the optical band gap by photoconduction measurements in cadmium phosphates. Gas thin films, and A12O3 in the form of thin film as well as single crystal. In addition to obtaining the band gap for these materials, we have also studied the traps in these materials. Interfacial surface states in MOS system have also been investigated. Many traps also exist in these materials and their photo depopulation yields the observed photoconduction.
URI:	http://142.54.178.187:9060/xmlui/handle/123456789/12320
Appears in Collections:	PSF Funded Projects

Files in This Item:

File	Description	Size	Format
FOR FULL TEXT PLEASE CONTACT.docx		15.38 kB	Microsoft Word XML	View/Open

DSpace JSPUI